Product Details

XTDIC-Micro 3D Microstrain Measurement

The XTDIC-Micro microscopic application measurement system combines optical microscopy with DIC digital image correlation technology to meet the needs of nanometer-level precision measurement.

Technical advantages

- Obtain three-dimensional coordinates, displacement, and strain data for the entire field.

- 3D display of measurement results

- Suitable for any material

- Fast, simple, and high-precision system calibration

- The measuring area is freely adjustable: from 1 to 10 mm.

- Strain measurement range: from a minimum of 0.01% to greater than 500%.

- Flexible and easy-to-use triggering function

Application Scope

- Microstructure and strain analysis (micrometer and nanometer scale)

- Material testing (Young's modulus, Poisson's ratio, elastoplastic properties)

- Strain calculation, elasticity assessment, component size measurement, and detection of nonlinear changes;

- Advanced materials (CFRP, wood, PE-containing fibers, metal foam, rubber, etc.)

Behavioral analysis of homogeneous and non-homogeneous materials during deformation

- Various homosexual and heterosexual transgender characteristics

- Component testing (measuring displacement and strain)

- Microscale dynamic strain measurement, such as fatigue testing;

- Biomechanics (bones, muscles, blood vessels, etc.)

- Fracture mechanical properties

- Nonlinear change detection

Technical parameters



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